Fast, light and accurate

SciAps handheld X-ray analyzers offer next-generation connectivity, test data management and reporting for the full range of compliance testing applications, including RoHS,  Halogen Free, CPSIA,  and lead paint in children’s playgrounds.

XRF is an approved analytical technique for screening various products for compliance testing, It’s the quickest and easiest way to pass/fail your products.

For RoHS, SciAps instruments comply with IEC 62321-3-1 and ASTM F261, the official methods that describe procedures for the analysis of lead, cadmium, chromium, mercury and total bromine by XRF. There are additional classifications, like Green for RoHS, which means complying with RoHS as well as restricting flame retardants containing Cl, Br and Sb. SciAps software allows for the ability to add elements like Sb and adjust pass/fail levels to what the customer requires.

SciAps engineers have been solving for RoHS from the beginning, through their roles at various companies. We have decades of experience designing the next generation of instruments to meet the growing needs of this market. We bring the best possible screening program to our customers based on accuracy, efficiency and value for the customer.


Now Available

Ultimate X-ray Analysis

SciAps X-505


Classic SDD

Performance and Value


PiN diode technology

Great Basic Analysis

X-550 XRF – At 2.75 lbs., it’s the lightest weight analyzer ever created, in a mostly metal frame for ultimate durability and duty cycle. Perfectly balanced and lightning fast – as in 1-2 seconds – you can test material all day long without fatigue. The narrow, slender form factor accesses the toughest test locations, with the latest 2.7″ (68.6mm) display for rear viewing of grade and chemistry.

X-200 XRF – Competitively priced for every performance requirement, this platform weighs about 3.4 lbs, making it about 0.5 lbs heavier than the X-550 platform, but still with industry leading speed and precision. Updated for improved heat dissipation, reduced weight, new user-interface. All internal electronics now use less power and operate at higher temperatures—no drift or shutdown.

X-50 XRF A great value for basic analysis, PiN technology processes about 10x lower X-ray count rates than SDD, resulting in a 3x reduction of precision. However, for many RoHS/WEEE applications, the performance is satisfactory and the X-50 is available at a lower price point. Includes the same advanced X-ray tube (operating at 50 kV max.), integrated camera, video, and Android platform.

Future-proof your instrument

SciAps RoHS app allows for the greatest customization in the industry. Take back control of your instrument. As regulations increase, you can add elements like Ni, Sb, Ba and others. Want tighter Pass/Fail requirements? Decrease levels to meet your own more stringent guidelines. No need to buy additional software or a new instrument. Just change settings and you’re ready for any new regulation.

Ease of use — the RoHS app

With years of experience in the RoHS market, SciAps designs software with the user in mind. Our automatic identification of material assures that no matter what sample is placed in front of the window, the results will be right. No need for changing back and for between different modes, calibrations or applications. The simple to use RoHS app does it all.

The best value for your money

Testing 4 ppm Cd with a Si Pin was unheard of a decade ago. Advancements in digital pulse processing and the extensive XRF experience at SciAps have produced the best value for money in the industry. While most instruments in the market have changed very little since RoHS or CPSIA was first introduced, SciAps newly designed software takes modern manufacturing into account.

  • State-of-the-art data management incorporated into a flexible Android system allows for the greatest customization and data management capabilities.
  • Redesigned housing with improved heat dissipation allows for high throughput testing that our compliance customers demand.
2010 SDD 2010 Si PiN SciAps X-50 PiN
Tube Power 4 W 4 W 5 W
keV 40 keV 40 keV 50 keV
Max uA 100 uA 100 uA 200 uA
Detector SDD Si Pin Si Pin
Processing Speed 300-550 MHz CPU,
128-500 MB RAM
300-550 MHz CPU,
128-500 MB RAM
1.2 GHz CPU,
Compliance Testing
Testing Time 120 sec 120 sec 60 sec
Typical Alloy Test 120 sec 300 sec 60 sec
LOD: Polymer Pb 2-5 ppm 3-10 ppm 2 ppm
LOD: Polymer Cd 30-50 ppm 30-50 ppm 4 ppm
LOD: Polymer Cr 40-60 ppm 30-60 ppm 2 ppm
LOD: Polymer Cl 0.1-0.3% 0.5-1% 60 ppm
LOD: Cu Alloy Cd 60-90 ppm 60-80 ppm 8 ppm
LOD: Sn Alloy Pb 60-90 ppm 120-150 ppm 80 ppm
Full-beam collimation

Why spend more for collimation just to receive 1/8th the power? SciAps XRF tight geometry and advanced design allows for a 4 mm beam spot without the need for a collimator. Collimators block X-rays in order to get the small beam size. This reduces the amount of X-rays going into the samples and thus increases the amount of testing time needed to get lower LODs. Using a full beam brings better results in a faster amount of time, increasing throughput for any testing program.

No-worry service

SciAps analyzers are incredibly durable, but every instrument needs maintenance. SciAps offers the lowest service costs in the industry, and we go one step further with a service program that caters to our customers’ needs, across every model, to keep you working at peak performance. Customer service is an extension of our commitment to provide you with exactly what you need, where — and when — you need it.

SciAps XRF Full Screening

SciAps XRF can be configured for multiple regulations to get the most out of your instrument. Get high throughput and precision for various matrices, all in one testing app.

RoHS/WEEE CPSIA Halogen Free/Green
Cd <100 ppm
Cr Cr6+ <1000 ppm
Hg <1000 ppm
Pb <1000 ppm <100 ppm
Br PBB PBDE <1000 ppm <900 ppm
Cl <900 ppm
Br + Cl <1500 ppm
Sb Sb2O3 <900 ppm

XRF mounted on the Test Station can be operated through SciAps Profile Builder software for PC or tablet to create a benchtop analyzer, allowing you to crank through hundreds of samples a day.

Rapid testing, high throughput

Setting up a reasonable screening program allows for rapid testing of the production line. This includes examining incoming material and outgoing QC to assure compliance. While each regulation has its unique requirements for passing and failing products, XRF is a non-destructive technique, so it minimizes the disruption and cost to the product line.

There are certain screening guidelines that need to be followed. Take Pb as an example. For RoHS, Pb pass/fail requirements in a homogenous material are:

Pb for RoHS: Pass ≤ 700 – 3σ ≤ Inconclusive ≤ 1300 + 3σ ≤ Fail

The Pb action level for RoHS is 1000 ppm. Using XRF for screening, the IEC guidelines put in a 30% buffer for pass/fail that is designated as inconclusive. With XRF, you can neither say it is a pass or fail, and further analysis is required. The inconclusive range also uses the error (σ) associated with the test into expanding the inconclusive region.

For CPSIA, it is different: Pb for CPSIA: Pass ≤ 70 – 1σ ≤ Inconclusive ≤ 130 + 1σ ≤ Fail

The CPSIA action level for Pb is 100 ppm. Using XRF in accordance with ASTM F2853-10e1 and ASTM 2617-08, there are additional requirements like sample preparation and relative standard deviation of three tests to take into consideration. The extension of the inconclusive zone only uses the error reported (σ) instead of three times that amount. To pass or fail for CPSIA, none of the three tests can fall within the inconclusive zone.

All elements and matrices

Five-beam analysis provides ultimate performance

50 keV 40 keV 30 keV 15 keV
RoHS Plastic Ag, Cd, Sn, Sb, Ba Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Zr, Mo, W, Hg, Tl, Pb, Bi Cl, K, Ca, Tl, V, Mn
RoHS Alloy Ag, Cd, Sn, Sb, Ba Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Zr, Nb, Mo, W, Au, Hg, Tl, Pb, Bi

XRF Compliance Testing Uses

With a decade plus of compliance testing experience, SciAps designs instruments to be the fastest and most precise for the growing needs of this market, and Android OS allows for the greatest customization and data management capabilities every time new information becomes available.

Further links for XRF and other compliance testing:

This page was updated on March 25th, 2021