Z-200 C+ LIBS Analyzer
The Z-200 C+ is a dedicated analyzer for alloy analysis including carbon content. It analyzes carbon content in stainless, down to 0.007 percent, for dependable separation of L and H grades. The C+ also analyzes carbon steels, including carbon equivalents (CE) for weldability. The analyzer is available in two versions. The Z-200 C comes with iron-base calibrations including carbon. The Z-200 C+ includes both iron and stainless bases and carbon. Additional bases may be added at time of purchase or any later date. Following in the tradition of our defy-obsolescence principle, any Z-200 or Z-200 C may be upgraded to the Z-200 C+ at any time for the price difference.
The Z uses the technique laser induced breakdown spectroscopy (LIBS), which has many similarities to spark OES. LIBS has been an established laboratory technique for 20+ years. It fires a pulsed laser at the material to create a plasma, instead of a continuous electric spark like spark OES. Light from the plasma is measured with an on-board spectrometer to determine individual wavelengths and thus what elements are present. The elemental content is quantified via onboard calibrations.
High resolution is critical. The Z-200 C+ is equipped with a dedicated third spectrometer optimized for the best wavelength resolution around the carbon line. Due to the many nearby iron lines, resolution better than 0.080 nm is a must. Powerful laser – onboard argon purge – high resolution spectrometer. It’s the key to rock solid, in-field carbon analysis for alloys.
Spectrometer/Range
190 nm – 625 nm
Contains a third spectrometer dedicated to the 190 – 230 nm range
The Essentials for Carbon Analysis in Alloys with Handheld LIBS
High-purity Argon and Purge
Argon purge is essential for quantitative analysis with LIBS and OES, and for carbon it’s critical. SciAps patented argon purge technique for LIBS is a key component for measuring carbon accurately, and at the concentration levels needed for L-grade stainless. The laser beam is about 100 um in diameter, thus a very small purge volume is needed for the argon purge. The Z uses about 1,000 times less argon than a spark OES, so that the argon source is a user-replaceable canister located in the Z’s handle. Operators can analyze up to 600 samples with the argon canister for most alloy testing, and 125-200 samples for carbon analysis. Carbon analysis requires averaging of several tests.
High Laser Pulse Energy and Frequency
The SciAps laser delivers 5-6 mJ/pulse on the sample, with a 50 Hz repetition rate. As any spark OES user knows, sample prep is critical for carbon analysis. The high energy and high rep rate laser (50 Hz) rapidly burns off surface contamination in order to get a good analysis. A good grind and a good pre-burn is as critical for LIBS analysis as it is for spark OES.
Laser Raster
Rastering is a must for accurate carbon tests with LIBS. The laser is typically 100 um diameter beam and even the best sample prep may not completely remove surface contamination on this distance scale. The Z moves the laser to 6 distinct locations and analyzes each spot for 0.5 seconds, for a 3 second test. The carbon algorithm then examines the resulting data from each location and can (optionally) reject test data with significant point-by-point discrepancies. The analyzer can be setup for manual or auto burn rejection. If a burn is rejected, the analyzer notifies the operator.
Weight
4 lbs with battery
Dimensions
8.25″ x 11.5″ x 4.5″
Display
5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic
Sample viewing
On-board camera/video for viewing sample before, during analysis, laser spot finder to show where laser strikes sample.
Auto-focus
Z-direction stage, computer controlled for manually or automatically adjusting laser focus location on sample. Essential for liquids analysis.
Comms/Data Transfer
Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software.
Available Apps
Alloy, Geochem (Mining), Empirical, Environmental Apps. New Apps are added regularly please check with company or website.
Excitation Source
5-6 mJ/pulse, 50 Hz repetition rate, 1064 nm laser source
Processing Electronics
ARM Cortex -A9 dual-core / 1.2 GHz Memory: 1 GB DDR2 RAM, 1 GB NAND
Spectral Data Acquisition
Spectral data collected in either ungated or gated operation, with user settable gate delays
Operation/Argon Purge
On-board, user replaceable argon cartridges for operating in argon purge environment. Air-based operation optional. Argon canister provides approximately 600 tests before replacement.
Laser Raster
On-board XY stage for rastering laser to discrete locations for targeted analysis or averaging. Raster pattern up to 16 x 16 grid, 256 locations.
Calibration Check
Internal shutter is also 316 stainless for totally automated calibration and wavelength scale validation.
Power
On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power.
Drift Correction
Only needed for higher accuracy analysis (argon purge). Automated drift correction using factory provided or user provided reference materials.
Grade library (alloy)
500+ grades, multiple libraries supported, grades may be added on analyzer or via PC software package (ProfileBuilder).
Data Storage
Results Storage: 8 GB SD
Security
Password protected usage (user level) and internal settings (admin).
Regulatory
CE, RoHS, USFDA registered. Class 3b laser. Sample sensor on-board, allows for operation under Class 1 conditions, subject to local LSO approval. CE, RoHS, USFDA registered.
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