X-50 XRF Analyzer
The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x – 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 70 eV less (greater width). However, for many applications, such as basic sorting of stainless, high temp, and copper alloys, or to analyze base or heavy metals in soils, ores, powders, etc., the PiN technology is satisfactory. The X-50 will NOT measure Mg, Al or Si in alloys. For some materials, X-50 can measure P and S at the 1% level. Limits of detection will be 3x higher (elevated) compared to SDD versions of the X. However, the X-50 features an attractive price point for the applications that work well. The X-50 includes the same advanced X-ray tube as other X models (operating at 40 kV max.), integrated camera, macro-camera, video, and the Android OS platform. The X-50 is available for alloy, environmental, mining/exploration, precious metals, car catalysts, coatings and an empirical app for industrial and user-customizable applications. Analyzers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user-defined empirical calibrations.
40 kV, Rh anode (alloy) or Au anode (Geochem, Soil, others)
7 mm2 PIN Diode, Standard DPP, 15k cps, 50% live
Standard Element Package
The standard element package for the X-50 is shown in the table below.
Require other elements? Just ask! We add or substitute elements frequently for specific applications.
|Application||Beam 1 (40 kV)||Beam 2 (10 kV)||Beam 3 (50 kV)|
|Geo-Mining||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U, Ag, Sn, Sb||S, K, Ca||N/A|
|Geo-Env Soil||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Mo, W, Tl, Hg, Pb, Bi, Ag, Cd, Sn, Sb||N/A||N/A|
|Alloy||Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Y, Zr, Nb, Mo, W, Ta, Hf, Re, Au, Pb, Bi, Ru, Pd, Ag, Cd, Sn, Sb||N/A||N/A|
|Precious Metals||Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, W, Au, Ge, Ir, Pt, Au, Pb, Bi, Zr, Mo, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb||N/A||N/A|
3.3 lbs with battery
7.25″ x 10.5″ x 4.5″
On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power, hot-swap capability (60s max swap time).
5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic.
Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software.
6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.
7mm2 PiN diode detector (active area), 190eV resolution FWHM at 5.95Mn K-alpha line.
6 position filter wheel for beam optimization.
Processing Electronics Host Processor
ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD
14-bit ADC with digitization rate of 80 MSPS 8K channel MCA USB 2.0 for high speed data transfer to host processor Digital Filtering implemented in FPGA for high throughput pulse processing 50nS – 24uS peaking time
Fundamental parameters. For Geochem and Env. Soil Apps, users may also choose “Compton Normalization” method and/ or use empirically derived calibrations.
Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.
Environmental Temp. Range
10°F to 130°F at 25% duty cycle.
Password protected usage (user level) and internal settings (admin).
CE, RoHS, USFDA registered, Canada RED Act.